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2 article(s) from Hähner, Georg

Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

John D. Parkin and
Georg Hähner

Beilstein J. Nanotechnol. 2016, 7, 492–500, doi:10.3762/bjnano.7.43

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Figure 1: Schematic side view of the microchannel with Poiseuille profile of the fluid and a cantilever that ...

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Figure 2: Optical images of the AFM cantilevers studied showing their plan view geometries (view from the tip...

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Figure 3: Force per unit length as a function of the fluid speed experienced by cantilever NCHV. The fixed en...

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Figure 4: Fluid-flow-dependent conversion factors α and β for some of the cantilevers studied. The conversion...

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Figure 5: Cantilever deflection of NCHV under fluid flow from the microchannel measured at the free end of th...

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Figure 6: Experimentally determined [Graphic 28] value for cantilever NCHV. The dashed line indicates the mean [Graphic 29] value for ...

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Supp Info

Full Research Paper

Published 30 Mar 2016

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Electron-beam patterned self-assembled monolayers as templates for Cu electrodeposition and lift-off

Zhe She,
Andrea DiFalco,
Georg Hähner and
Manfred Buck

Beilstein J. Nanotechnol. 2012, 3, 101–113, doi:10.3762/bjnano.3.11

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Figure 1: (a) Scheme of SAM controlled electrodeposition and lift-off of metal structures. Starting from a un...

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Figure 2: (a) Illustration of different types of defects in a SAM. Domain boundaries (1) and substrate steps ...

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Figure 3: Linear-sweep voltammograms comparing the electrodeposition of Cu on clean (black squares) and SAM m...

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Figure 4: (a,b) Chronoamperograms of single potential (a) and double potential (b) deposition processes on a ...

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Figure 5: SEM images of Cu nucleation and growth on a MBP0-SAM on Au/Ag/Mica prepared at 65 °C for 24 h. (a) ...

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Figure 6: Electrochemical deposition of Cu on e-beam-patterned MBP0-SAM/Au/Si. (a) SEM image of a series of p...

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Figure 7: SEM images of a SAM templated copper deposit on the original MBP0 coated Au/Si substrate (a) and af...

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Figure 8: AFM topography images of Cu electrodeposited onto an e-beam-patterned MBP0-SAM on Au/Si (a) before ...

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Figure 9: AFM images of Cu electrodeposition onto a MBP0/Au/Si sample demonstrating the quality of passivatio...

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Figure 10: (a,b) AFM topography images and height profiles along the lines indicated, comparing the roughness ...

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Full Research Paper

Published 06 Feb 2012

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